Atomic Force Microscope (AFM)

XE-100 AFM with optical head and Hysitron Triboscope adapter head
The XE-100 AFM provides the ultimate AFM/SPM solution for Non-Contact nanoscale metrology of small samples in data storage, semiconductors, materials science, polymers, electro chemistry and other applications in nanoscience and engineering.
XE-100 AFM with optical head:
     •  True Non-Contact Mode
     •  Contact mode
     •  Intermittent mode
     •  Lateral Force Microscopy
     •  Force – distance spectroscopy