Facilities

Atomic Force Microscope (AFM)



Model:
XE-100 AFM with optical head and Hysitron Triboscope adapter head
 
The XE-100 AFM provides the ultimate AFM/SPM solution for Non-Contact nanoscale metrology of small samples in data storage, semiconductors, materials science, polymers, electro chemistry and other applications in nanoscience and engineering.
 
XE-100 AFM with optical head:
Capabilities:
     •  True Non-Contact Mode
     •  Contact mode
     •  Intermittent mode
     •  Lateral Force Microscopy
     •  Force – distance spectroscopy