Atomic Force Microscope (AFM)

AFM_1 AFM_2

Model: XE-100 AFM with optical head and Hysitron Triboscope adapter head

The XE-100 AFM provides the ultimate AFM/SPM solution for Non-Contact nanoscale metrology of small samples in data storage, semiconductors, materials science, polymers, electro chemistry and other applications in nanoscience and engineering.

XE-100 AFM with optical head:
Capabilities:

  • True Non-Contact Mode
  • Contact mode
  • Intermittent mode
  • Lateral Force Microscopy
  • Force – distance spectroscopy
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King Abdullah bin Abdulaziz Al Saud, 1924 – 2015

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